The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Nov. 14, 2022
Applicant:

Beijing Changcheng Institute of Metrology & Measurement, Avic, Beijing, CN;

Inventors:

Tengfei Wu, Beijing, CN;

Linjie Lv, Beijing, CN;

Jibo Han, Beijing, CN;

Chuanqing Xia, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/58 (2006.01); G01S 7/481 (2006.01);
U.S. Cl.
CPC ...
G01S 17/58 (2013.01); G01S 7/4814 (2013.01); G01S 7/4818 (2013.01);
Abstract

Disclosed is a photonic doppler velocimetry (PDV) system for ultra-high-speed instantaneous measurement, relating to laser velocity interferometry. The PDV system includes a laser velocity interferometry module, a microwave photonic module, and a data acquisition and signal processing module. The laser velocity interferometry module includes a continuous-wave laser, a circulator, a fiber optic probe, and a first photodetector. The microwave photonic module includes a femtosecond-pulse laser, a first dispersion optical fiber, a second dispersion optical fiber, a Mach-Zehnder (M-Z) modulator, and an optical fiber amplifier. The data acquisition and signal processing module includes a second photodetector, an oscilloscope, and a computer.


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