This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Beijing Changcheng Institute of Metrology & Measurement, Avic. Active years: 2024-2025.
Company Filing History:
Years Active: 2024-2025
Title: Chuanqing Xia: Innovator in Photonic Measurement Technologies
Introduction
Chuanqing Xia is a prominent inventor based in Beijing, China. He has made significant contributions to the field of photonic measurement technologies, holding 2 patents that showcase his innovative approach to high-speed measurement systems.
Latest Patents
One of his latest patents is the "Photonic Doppler Velocimetry (PDV) System for Ultra-High-Speed Instantaneous Measurement." This invention relates to laser velocity interferometry and includes a laser velocity interferometry module, a microwave photonic module, and a data acquisition and signal processing module. The system is designed to provide high-precision measurements of velocity using advanced photonic techniques.
Another notable patent is the "High-Precision Rotation Speed Measurement Method Based on Femtosecond Optical Frequency Comb." This method involves a unique setup where the rotation axis of the object being measured is coplanar and perpendicular to the optical path main axis. The method locks the repetition frequency and carrier-envelope offset frequency of the femtosecond optical frequency comb during measurement, allowing for accurate calculation of the rotation speed.
Career Highlights
Chuanqing Xia is affiliated with the Beijing Changcheng Institute of Metrology and Measurement, a leading research institution in the field of metrology. His work has significantly advanced the capabilities of measurement technologies, particularly in high-speed applications.
Collaborations
He has collaborated with notable colleagues, including Jibo Han and Tengfei Wu, contributing to various projects that enhance the understanding and application of photonic technologies.
Conclusion
Chuanqing Xia's innovative work in photonic measurement technologies has established him as a key figure in the field. His patents reflect a commitment to advancing measurement precision and speed, making significant impacts in various applications.