Wuhan, China

Jiawei Lu

This inventor holds 1 USPTO granted patent. Top assignee: Wuhan United Imaging Life Science Instrument Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jiawei Lu. Retrieved from https://idiyas.com/inventor/jiawei-lu-c5aqb567

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Jiawei Lu: Innovator in Image Data Management

Introduction

Jiawei Lu is a prominent inventor based in Wuhan, China. He has made significant contributions to the field of image data management, particularly through his innovative patent.

Latest Patents

Jiawei Lu holds a patent titled "Methods and systems for indexing, classifying, searching image data." This patent outlines systems and methods for managing image data effectively. The methods include running a first process to store raw data collected from a scan of a subject into the first storage space of a storage device. Additionally, it involves generating first information related to the raw data. A second process is then run to obtain this first information and store it in a second storage space. Ultimately, the methods allow for reconstructing the raw data into a reconstruction image of the subject based on the first information.

Career Highlights

Jiawei Lu is associated with Wuhan United Imaging Life Science Instrument Co., Ltd., where he applies his expertise in image data management. His work has been instrumental in advancing the capabilities of imaging technologies.

Collaborations

Some of his notable coworkers include Heying Niu and Wenting Xu, who contribute to the innovative environment at their company.

Conclusion

Jiawei Lu's contributions to image data management through his patent demonstrate his commitment to innovation in technology. His work continues to influence the field and enhance imaging processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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