The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Mar. 29, 2023
Applicant:

Wuhan United Imaging Life Science Instrument Co., Ltd., Hubei, CN;

Inventors:

Heying Niu, Wuhan, CN;

Jiawei Lu, Wuhan, CN;

Wenting Xu, Wuhan, CN;

Yao Xing, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2005.12); G06T 11/00 (2005.12);
U.S. Cl.
CPC ...
G06F 3/0608 (2012.12); G06F 3/0652 (2012.12); G06F 3/0683 (2012.12); G06T 11/003 (2012.12);
Abstract

Systems and methods for image data management are provided. The methods may include by running a first process, storing raw data collected in a scan of a subject into first storage space of the at least one storage device, and generating first information relating to the raw data. The methods may include by running a second process, obtaining the first information from the first process and storing the first information into second storage space of the at least one storage device. The methods may further include reconstructing the raw data into a reconstruction image of the subject based on the first information.


Find Patent Forward Citations

Niu, Heying. (2025). Methods and systems for indexing, classifying, searching image data (U.S. Patent No. 12287967). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12287967

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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