Taichung, Taiwan

Jiao-Rou Liao


Average Co-Inventor Count = 6.0

ph-index = 1


Location History:

  • Taichung, TW (2021)
  • New Taipei, TW (2023)

Company Filing History:


Years Active: 2021-2023

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2 patents (USPTO):

Title: Jiao-Rou Liao: Innovator in Semiconductor Inspection Technologies

Introduction

Jiao-Rou Liao is a prominent inventor based in Taichung, Taiwan. He has made significant contributions to the field of semiconductor inspection technologies. With a total of two patents to his name, Liao's work focuses on enhancing the efficiency and accuracy of defect detection in semiconductor devices.

Latest Patents

Liao's latest patents include a "Method and system for map-free inspection of semiconductor devices." This innovative system and method aim to detect defects in a hole array on a substrate. The process involves scanning the substrate surface using at least one optical detector, generating images of the surface, and analyzing these images to identify defects based on predetermined criteria. Another notable patent is the "Topological scanning method and system." This method outlines a comprehensive approach for scanning and analyzing surfaces, which includes determining scan parameters based on user input, scanning the target surface, generating images, and correcting these images to remove undesired features for accurate analysis.

Career Highlights

Jiao-Rou Liao is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work at this esteemed company has allowed him to develop and refine his innovative technologies, contributing to advancements in semiconductor manufacturing processes.

Collaborations

Liao has collaborated with several talented individuals in his field, including Sheng-Hsiang Chuang and Cheng-Kang Hu. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies in semiconductor inspection.

Conclusion

Jiao-Rou Liao's contributions to semiconductor inspection technologies through his innovative patents demonstrate his commitment to advancing the industry. His work not only enhances defect detection processes but also sets a foundation for future innovations in semiconductor manufacturing.

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