This inventor holds 1 USPTO granted patent. Top assignee: National Institute of Metrology, China. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Jianyun He - Innovator in Electrical Resistivity Testing
Introduction
Jianyun He is a notable inventor based in Beijing, China. He has made significant contributions to the field of electrical resistivity testing, particularly in relation to conductive fiber materials. His innovative approach has led to the development of a unique probe module that enhances testing accuracy and efficiency.
Latest Patents
Jianyun He holds a patent for a "Probe module for testing of electrical resistivity of conductive fiber materials." This invention features a probe module that includes four gland spring holes uniformly formed in the bottom surface of the gland main body. One end of a pressure spring is abutted against the top of the gland spring holes, while the other end contacts a conductive sheet. The probe frame is designed with an external thread structure that matches an internal thread structure of an internal threaded hole, allowing for secure attachment. Additionally, the probe frame houses a spring probe, and a pressure sensor is in contact with the conductive sheet, enhancing the module's functionality.
Career Highlights
Jianyun He is affiliated with the National Institute of Metrology, China, where he continues to advance research in metrology and testing technologies. His work is characterized by a commitment to innovation and precision in measurement techniques.
Collaborations
He has collaborated with notable colleagues, including Senlin Jin and Lingling Ren, contributing to various projects that aim to improve testing methodologies in the field of electrical resistivity.
Conclusion
Jianyun He is a distinguished inventor whose work in developing a probe module for testing electrical resistivity has made a significant impact in the field. His contributions continue to influence advancements in metrology and testing technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile