This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Nanjing University of Aeronautics and Astronautics. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024
Title: Innovations of Jianping Yang in 3D Measurement Robotics.
Introduction
Jianping Yang is a notable inventor based in Nanjing, China. He has made significant contributions to the field of robotics, particularly in the area of three-dimensional measurement technology. His innovative work has led to the development of a unique method that enhances the efficiency and accuracy of 3D measurement robots.
Latest Patents
Jianping Yang holds a patent for a "Feature-guided scanning trajectory optimization method for three-dimensional measurement robot." This patent outlines a comprehensive approach that includes building a 3D digital model of an aircraft surface, obtaining its size, and extracting features to be measured. The method involves classifying these features, calculating geometric parameters, and generating both initial and optimized scanning trajectories using a modified ant colony optimization algorithm.
Career Highlights
Jianping Yang is affiliated with Nanjing University of Aeronautics and Astronautics, where he continues to advance research in robotics and measurement technologies. His work is characterized by a strong focus on practical applications that can significantly improve the performance of measurement systems in various industries.
Collaborations
Some of his notable coworkers include Jun Wang and Hangbin Zeng, who contribute to the collaborative research environment at Nanjing University of Aeronautics and Astronautics.
Conclusion
Jianping Yang's innovative contributions to 3D measurement robotics exemplify the intersection of technology and engineering. His patented methods are paving the way for advancements in the field, showcasing the importance of innovation in enhancing measurement accuracy and efficiency.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile