The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

May. 23, 2023
Applicant:

Nanjing University of Aeronautics and Astronautics, Nanjing, CN;

Inventors:

Jun Wang, Nanjing, CN;

Hangbin Zeng, Nanjing, CN;

Yuanpeng Liu, Nanjing, CN;

Zhengshui Kang, Nanjing, CN;

Jianping Yang, Nanjing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); G01B 21/20 (2006.01); B25J 19/02 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1664 (2013.01); G01B 21/20 (2013.01); B25J 19/02 (2013.01);
Abstract

A feature-guided scanning trajectory optimization method for a 3D measurement robot, including: building a 3D digital model of an aircraft surface; obtaining a size of the 3D digital model; extracting features to be measured; classifying the features to be measured; calculating a geometric parameter of each type of features to be measured; generating an initial scanning trajectory of each type of features to be measured; building a constraint model of the 3D measurement robot; optimizing the initial scanning trajectory into a local optimal scanning trajectory; and planning a global optimal scanning trajectory of each type of features to be measured on the aircraft surface by using a modified ant colony optimization algorithm.


Find Patent Forward Citations

Loading…