Jianli He

Title: **Innovative Contributions of Inventor Jianli He**

Introduction

Jianli He is a distinguished inventor based in Goleta, California. With a strong focus on advancing the capabilities of atomic force microscopy (AFM), He has secured two patents that demonstrate his innovative approach to measuring electrical properties.

Latest Patents

Jianli He's latest patents focus on a "Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode." This inventive apparatus and method are designed for collecting topographical, mechanical, and electrical property data with an AFM in either a single-pass or dual-pass operation. The use of peak force tapping (PFT) mode enhances the sensitivity of electrical property measurement by allowing the use of a wide range of probes, thereby improving the overall effectiveness of the measurements.

Career Highlights

Currently, Jianli He contributes his expertise at Bruker Nano GmbH, a company known for its pioneering work in nanotechnology and imaging solutions. His role at Bruker allows him to refine and implement his innovative methods, further pushing the boundaries of scientific research in electrical property measurement.

Collaborations

Throughout his career, Jianli He has worked closely with fellow researchers, including Chunzeng Li and Yan Hu. These collaborations have enriched his work and have been instrumental in the development of his patented technologies, showcasing the importance of teamwork in the field of scientific innovation.

Conclusion

Jianli He stands out as an influential figure in the realm of innovations related to atomic force microscopy. His patents reflect significant advancements in electrical property measurement, which have important implications for scientific research and technology. With his continued efforts at Bruker Nano GmbH, he is poised to drive further innovations in the field.