Jianing Shi

Title: **Innovative Contributions of Jianing Shi in Semiconductor Metrology**

Introduction

Jianing Shi, an accomplished inventor based in Sunnyvale, CA, has made significant strides in the field of semiconductor metrology. With a remarkable portfolio comprising seven patents, she focuses on advanced techniques that leverage machine learning methodologies to enhance material property analysis.

Latest Patents

Among Jianing Shi’s latest innovations is a patent for a system designed for parsing material properties from within second harmonic generation (SHG) signals. This invention relates to metrology systems that involve directing radiation onto a wafer, detecting the SHG radiation produced, and correlating this signal to various electrical properties of the wafer. The system includes methods for parsing the SHG signal to filter out contributions from specific material properties, such as thickness.

Another notable patent involves surface sensing systems and methods for imaging scanned surfaces via sum-frequency vibrational spectroscopy. This method includes simultaneously exposing a sampled location to both a visible light beam and a tunable infrared beam. By varying the infrared beam's frequency, the method induces optical resonance within the structure of the sample, allowing for detailed imaging based on the received emitted light.

Career Highlights

Jianing Shi's impressive career includes roles at leading companies such as Femtometrix, Inc. and The Boeing Company. Her work at these organizations has allowed her to apply her innovative ideas in practical settings, significantly contributing to advancements in semiconductor technologies and materials science.

Collaborations

Throughout her career, Jianing has collaborated with professionals like John Paul Changala and Jeffrey H Hunt. These partnerships have bolstered her research efforts and expanded the reach of her technological advancements in the field.

Conclusion

Jianing Shi’s innovative contributions have substantially impacted semiconductor metrology, demonstrating her commitment to advancing technology through her inventive spirit. With a diverse set of patents and a collaborative background, she is poised to continue making meaningful contributions to the field.