This inventor holds 2 USPTO granted patents. Top assignee: Chengdu University of Technology. Active years: 2025-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025-2026
Title: Jianhua He: Innovator in Geo-Stress Evaluation
Introduction
Jianhua He is a prominent inventor based in Chengdu, China. He has made significant contributions to the field of geo-stress evaluation, particularly in the context of deep shale gas reservoirs. His innovative methods have the potential to enhance the understanding of geo-stress characteristics, which is crucial for effective resource extraction.
Latest Patents
Jianhua He holds a patent titled "Method of quantitative evaluation on structural disturbance characteristics of present in-situ geo-stress in deep shale gas reservoirs." This patent discloses a comprehensive method for quantitatively evaluating structural disturbance characteristics of in-situ geo-stress. The process involves measuring geomechanics key parameters, interpreting rock mechanics, establishing geological models, and performing simulations to predict geo-stress states. The method ultimately allows for a quantitative evaluation of geo-stress structural disturbances.
Career Highlights
Jianhua He is affiliated with Chengdu University of Technology, where he applies his expertise in geo-stress evaluation. His work has been instrumental in advancing the understanding of geo-stress in shale gas reservoirs, contributing to both academic research and practical applications in the energy sector.
Collaborations
Jianhua He has collaborated with notable colleagues, including Hucheng Deng and Ruolong Ma. Their joint efforts have furthered research in the field of geo-stress evaluation and have led to advancements in methodologies used in the industry.
Conclusion
Jianhua He is a key figure in the field of geo-stress evaluation, with a focus on deep shale gas reservoirs. His innovative patent and collaborative efforts highlight his commitment to advancing this important area of research.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile