Sichuan, China

Jian Yan

This inventor holds 1 USPTO granted patent. Top assignee: Chinese Academy of Sciences. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jian Yan. Retrieved from https://idiyas.com/inventor/jian-yan-2xgsjriw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations of Jian Yan in Template Mark Detection

Introduction

Jian Yan is a notable inventor based in Sichuan, China. He has made significant contributions to the field of image processing and detection methods. His innovative work focuses on enhancing template mark detection and position correction using a single camera.

Latest Patents

Jian Yan holds a patent for a "Template mark detection method and template position correction method based on single camera." This patent outlines a comprehensive approach that includes image collection, binary image preprocessing, corner detection, edge and line detection, and linear fitting to accurately detect marks on templates. The method is designed to improve the efficiency and accuracy of template mark detection.

Career Highlights

Jian Yan is affiliated with the Chinese Academy of Sciences, where he conducts research and development in advanced imaging techniques. His work has been instrumental in pushing the boundaries of what is possible in template detection technology.

Collaborations

Jian Yan collaborates with esteemed colleagues such as Xiangang Luo and Chengwenli Li. Their combined expertise contributes to the advancement of innovative solutions in their field.

Conclusion

Jian Yan's contributions to template mark detection represent a significant advancement in the field of image processing. His innovative methods and collaborative efforts continue to influence the development of new technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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