The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
Dec. 27, 2022
The Institute of Optics and Electronics, the Chinese Academy of Sciences, Sichuan, CN;
Xiangang Luo, Sichuan, CN;
Chengwenli Li, Sichuan, CN;
Minggang Liu, Sichuan, CN;
Jian Yan, Sichuan, CN;
Changtao Wang, Sichuan, CN;
Abstract
Provided are template mark detection method and template position correction method based on single camera, including: performing image collection on mark on template by single camera, and obtaining binary image after preprocessing; performing corner detection of jagged edges on binary image to obtain corner set of jagged edges; performing edge detection and line detection sequentially on binary image to obtain set of edge line segments from coarse detection; traversing such set, and judging and retaining collinear line segments, to obtain set of collinear line segments from coarse detection; traversing corner set of jagged edges, for point-line collinearity judgment with line segments in set of collinear line segments from coarse detection, to obtain set of point-line from fine detection; and performing linear fitting on set of point-line from fine detection, and calculating an inclination angle of each straight line through an arctan function, thus completing detection of mark.