Chengwenli Li

Title: Chengwenli Li: Innovator in Template Mark Detection

Introduction

Chengwenli Li is a notable inventor based in Sichuan, China. He has made significant contributions to the field of image processing and detection methods. His innovative work focuses on enhancing template mark detection and position correction using a single camera.

Latest Patents

Chengwenli Li holds a patent for a "Template mark detection method and template position correction method based on single camera." This patent outlines a comprehensive approach that includes performing image collection on marks using a single camera, obtaining a binary image after preprocessing, and conducting corner detection on jagged edges. The method further involves edge and line detection to identify collinear line segments, ultimately leading to the detection of marks through linear fitting and angle calculation.

Career Highlights

Chengwenli Li is affiliated with the Chinese Academy of Sciences, where he continues to advance research in his field. His work has garnered attention for its practical applications in various technological domains.

Collaborations

Chengwenli Li has collaborated with notable colleagues, including Xiangang Luo and Minggang Liu, contributing to a dynamic research environment that fosters innovation.

Conclusion

Chengwenli Li's contributions to template mark detection exemplify the intersection of technology and innovation. His work not only enhances detection methods but also paves the way for future advancements in image processing.