Jian Ren Lai

Title: Innovations of Jian Ren Lai in Metal Ion Detection

Introduction

Jian Ren Lai is a notable inventor based in Changhua County, Taiwan. He has made significant contributions to the field of metal ion detection through his innovative patent. His work focuses on developing advanced equipment and methods for detecting metal ions, which has important applications in various industries.

Latest Patents

Jian Ren Lai holds a patent for "Metal ion detection equipment and metal ion detection method." This invention includes a porous silicon resonant cavity structure, an electrochemical device, and a spectrum detecting device. The equipment allows a sample solution to permeate into the porous silicon resonant cavity structure. The electrochemical device reduces a to-be-detected metal ion from the sample solution into a detectable metal. Subsequently, the spectrum detecting device captures the spectral variation of reflective light from the porous silicon resonant cavity structure.

Career Highlights

Jian Ren Lai is affiliated with Tsinghua University, where he continues to engage in research and development in the field of metal ion detection. His work has garnered attention for its innovative approach and practical applications.

Collaborations

Some of his notable coworkers include Fan-Gang Tseng and Jen-Kuei Wu, who have collaborated with him on various research projects.

Conclusion

Jian Ren Lai's contributions to metal ion detection technology highlight his innovative spirit and dedication to advancing scientific research. His patent represents a significant step forward in the field, showcasing the potential for improved detection methods.