The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Dec. 05, 2016
Applicant:

National Tsing Hua University, Hsinchu, TW;

Inventors:

Fan-Gang Tseng, Taipei, TW;

Jen-Kuei Wu, New Taipei, TW;

Jian Ren Lai, Changhua County, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); B01J 19/08 (2006.01); G01N 33/18 (2006.01); G01N 21/77 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4738 (2013.01); B01J 19/088 (2013.01); G01N 21/7746 (2013.01); G01N 33/18 (2013.01); B01J 2219/0801 (2013.01); B01J 2219/0809 (2013.01); B01J 2219/0815 (2013.01); B01J 2219/0877 (2013.01); G01N 2021/7726 (2013.01); G01N 2201/12 (2013.01);
Abstract

A metal ion detection equipment and a metal ion detection method are provided. The metal ion detection equipment includes a porous silicon resonant cavity structure, an electrochemical device and a spectrum detecting device. A sample solution permeates into the porous silicon resonant cavity structure. A to-be-detected metal ion of the sample solution in the porous silicon resonant cavity structure is reduced into a to-be-detected metal by the electrochemical device. The spectrum detecting device detects a spectral variation of a reflective light from the porous silicon resonant cavity structure.


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