Suzhou, China

Jian Bao

This inventor holds 1 USPTO granted patent. Top assignee: Soochow University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jian Bao. Retrieved from https://idiyas.com/inventor/jian-bao-4heho06z

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Jian Bao

Introduction

Jian Bao is a notable inventor based in Suzhou, China. He has made significant contributions to the field of optical systems and imaging spectrometers. His work focuses on enhancing the performance and accuracy of optical devices through innovative design methods.

Latest Patents

Jian Bao holds a patent for a "Method of wavenumber linearity dispersion optical system and imaging spectrometer." This invention discloses a design method that includes building an optical system with a grating, a prism, and an objective lens arranged sequentially. The grating adjoins the prism, and the design aims to achieve higher wavenumber linearity through objective-lens-aberration compensated wavenumber linearity. The patent outlines the process of defining a linearity evaluation coefficient RMS and optimizing the objective lens based on compensations for distortion and longitudinal chromatic aberration.

Career Highlights

Jian Bao is affiliated with Soochow University, where he continues to engage in research and development in optical technologies. His innovative approach has led to advancements in imaging spectrometry, which is crucial for various scientific applications.

Collaborations

Jian Bao has collaborated with notable colleagues, including Qiuyang Shen and Xinhua Chen. Their combined expertise contributes to the ongoing research and development efforts in their field.

Conclusion

Jian Bao's contributions to optical systems and imaging spectrometers highlight his innovative spirit and dedication to advancing technology. His patent reflects a significant step forward in achieving higher accuracy in optical measurements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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