Company Filing History:
Years Active: 2021
Title: Jiamu Xiao: Innovator in High Voltage ESD Protection Technology
Introduction
Jiamu Xiao is a talented inventor based in Chengdu, China. He has made significant contributions to the field of electronics, particularly in the development of high voltage electrostatic discharge (ESD) protection devices.
Latest Patents
Jiamu holds a patent for a novel high voltage ESD protection device. The invention features a P-type substrate paired with a first NWELL region positioned on the left upper part of the substrate. The device includes an NP contact region located at the upper part of the NWELL region and an N+ contact region on the right upper part of the P-type substrate, distinct from the first NWELL region. Additionally, a P+ contact region is tangential to the N+ contact region. The NTOP layer is arranged on the right of the NP contact region within the NWELL region. The NP contact region connects to a metal piece forming a metal anode, while the N+ and P+ contact regions interconnect via a metal piece to create a metal cathode.
Career Highlights
Jiamu works at the University of Electronic Science and Technology of China, where he focuses on exploring innovative solutions for ESD protection. His work aims to enhance the reliability of electronic devices against electrostatic discharge, a crucial factor in safeguarding sensitive electronic components.
Collaborations
Throughout his career, Jiamu has collaborated with remarkable colleagues such as Ming Qiao and Zhao Qi. Their joint efforts in research and development have contributed to advancements in ESD protection technologies, showcasing the collaborative spirit present in the academic research community.
Conclusion
Jiamu Xiao's contributions to high voltage ESD protection devices underscore the importance of innovation in electronics safety. With his patent and ongoing research at the University of Electronic Science and Technology of China, Jiamu continues to play a pivotal role in enhancing the durability and effectiveness of electronic devices against electrostatic discharge.