Jiajia Peng

Title: Jiajia Peng: Innovator in Substrate Inspection Technology

Introduction

Jiajia Peng is a notable inventor based in Beijing, China. She has made significant contributions to the field of substrate inspection technology. Her innovative work has led to the development of a unique device that enhances the efficiency and accuracy of substrate inspections.

Latest Patents

Jiajia Peng holds a patent for a substrate inspection device and method. This device includes a laser emitting unit, which is positioned on one side of a transmission device. It emits a laser beam to each substrate during inspection. The laser receiving unit, located on the opposite side, captures the laser beam that passes through the substrate. A calculation unit then determines the transmissibility of the laser beam based on the intensity of the emitted and received beams. This technology is crucial for assessing whether the line width of a black matrix in the substrate falls within a predetermined range.

Career Highlights

Throughout her career, Jiajia Peng has worked with prominent companies in the technology sector. She has been associated with BOE Technology Group Co., Ltd. and Hefei Xinsheng Optoelectronics Technology Co., Ltd. Her experience in these organizations has allowed her to refine her skills and contribute to cutting-edge innovations in substrate inspection.

Collaborations

Jiajia has collaborated with several professionals in her field, including Peng Luo and He Wang. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

Jiajia Peng's contributions to substrate inspection technology exemplify her innovative spirit and dedication to her field. Her patent and career achievements highlight her role as a leading inventor in this specialized area.