The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Jun. 15, 2015
Boe Technology Group Co., Ltd., Beijing, CN;
Hefei Xinsheng Optoelectronics Technology Co., Ltd., Hefei, Anhui, CN;
Peng Luo, Beijing, CN;
He Wang, Beijing, CN;
Xin Fang, Beijing, CN;
Jiajia Peng, Beijing, CN;
Xiang Liu, Beijing, CN;
Abstract
A substrate inspection device includes a laser emitting unit, arranged at one side of a transmission device, and configured to emit a laser beam to each substrate to be inspected on the transmission device when the substrate to be inspected is moved to an inspection position; a laser receiving unit, arranged at the other side of the transmission device, and configured to receive the laser beam transmitted through the substrate to be inspected; and a calculation unit, configured to calculate transmissibility of the laser beam relative to the substrate to be inspected based on an intensity of the laser beam emitted by the laser emitting unit and an intensity of the laser beam received by the laser receiving unit, and determine whether a line width of a black matrix in the substrate to be inspected is within a predetermined range of the line width based on the transmissibility.