Daejeon, South Korea

Ji Min Nam

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Korea Advanced Institute of Science and Technology. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ji Min Nam. Retrieved from https://idiyas.com/inventor/ji-min-nam

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Ji Min Nam: Innovator in Medical Imaging Technology

Introduction

Ji Min Nam is a prominent inventor based in Daejeon, South Korea. He has made significant contributions to the field of medical imaging technology. His innovative approach focuses on enhancing the accuracy and efficiency of joint segmentation in medical images.

Latest Patents

Ji Min Nam holds a patent for a method and apparatus for fully automated segmentation of joints using patient-specific optimal thresholding and a watershed algorithm. This patent outlines a comprehensive method for automatically segmenting a joint from medical images. The process involves extracting region information from the medical image, generating masks, and segmenting the target object based on these masks.

Career Highlights

Ji Min Nam is affiliated with the Korea Advanced Institute of Science and Technology, where he continues to advance his research in medical imaging. His work has garnered attention for its potential to improve diagnostic accuracy in medical practices.

Collaborations

He collaborates with notable colleagues, including Jung Jin Kim and InGwun Jang, who contribute to his research endeavors.

Conclusion

Ji Min Nam's innovative work in medical imaging technology exemplifies the impact of patents on advancing healthcare solutions. His contributions are paving the way for more precise medical diagnostics and treatment options.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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