This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: K-Mac. Active years: 2007.
Company Filing History:
Years Active: 2007
Title: Innovations of Ji Jong Park in Thin Film Measurement Technology.
Introduction
Ji Jong Park is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of thin film measurement technology. His innovative approach has led to the development of a unique apparatus that enhances the accuracy and efficiency of measuring thin films.
Latest Patents
Ji Jong Park holds a patent for an "Apparatus for measuring characteristics of thin film by means of two-dimensional detector and method of measuring the same." This invention relates to a non-contact, non-destructive measuring apparatus that assesses the thickness profile and refractive index distribution of single or multiple layers of thin films using reflectometry principles. By employing multiple narrow band-pass optical filters and a two-dimensional array of CCD sensors, the apparatus can simultaneously measure local area-wise thickness profiles and refractive index distributions of thin films on a substrate.
Career Highlights
Ji Jong Park is currently associated with K-Mac, where he continues to innovate in the field of optical measurement technologies. His work has garnered attention for its practical applications in various industries that utilize thin films.
Collaborations
Ji Jong Park collaborates with talented individuals such as Joong Whan Lee and Yeong Ryeol Kim. Their combined expertise contributes to the advancement of measurement technologies.
Conclusion
Ji Jong Park's contributions to thin film measurement technology exemplify the impact of innovative thinking in scientific research. His patented apparatus represents a significant advancement in the field, showcasing the potential for non-destructive measurement techniques.