Linkoping, Sweden

Jesper Otterholm

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Vantor Sweden Ab. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jesper Otterholm. Retrieved from https://idiyas.com/inventor/jesper-otterholm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Jesper Otterholm: Innovator in 3D Reconstruction Technology

Introduction

Jesper Otterholm is a notable inventor based in Linkoping, Sweden. He has made significant contributions to the field of 3D reconstruction technology. His innovative work has led to the development of methods and systems that enhance the accuracy and efficiency of 3D data generation.

Latest Patents

Jesper holds 1 patent for his invention titled "Methods, computer program products and systems for 3D reconstruction." This patent describes a method for 3D reconstruction that involves obtaining a set of overlapping images, performing image registration, and generating a 3D data set based on the registered images. The method aims to ensure the positional accuracy of each image in relation to a reference 3D data set, thereby improving the quality of the reconstructed 3D data.

Career Highlights

Jesper Otterholm is associated with Vantor Sweden AB, where he applies his expertise in 3D reconstruction technology. His work at Vantor has positioned him as a key player in advancing innovative solutions in this domain.

Collaborations

Jesper has collaborated with talented individuals such as Jonas Dehlin and Sanna Ringqvist. These collaborations have contributed to the development of cutting-edge technologies in the field.

Conclusion

Jesper Otterholm's contributions to 3D reconstruction technology exemplify the impact of innovation in enhancing data accuracy and efficiency. His work continues to influence advancements in this important area of research and development.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…