Voorhees, NJ, United States of America

Jerzy W Luk-Paszyc

This inventor holds 2 USPTO granted patents. Top assignee: Lockheed Martin Corporation. Active years: 2008-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jerzy W Luk-Paszyc. Retrieved from https://idiyas.com/inventor/jerzy-w-luk-paszyc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 13(Granted Patents)


Location History:

  • Voorhees, NJ (US) (2008)
  • Vorhees, NJ (US) (2013)

Company Filing History:


Years Active: 2008-2013

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2 patents (USPTO):Explore Patents

Title: Jerzy W Luk-Paszyc: Innovator in Radar Technology

Introduction

Jerzy W Luk-Paszyc is a notable inventor based in Voorhees, NJ (US). He has made significant contributions to radar technology, holding 2 patents that showcase his innovative approach to solving complex problems in atmospheric refraction and navigation systems.

Latest Patents

One of his latest patents is titled "Correction of radar beam refraction using electro-optical measurements." This method determines the atmospheric refraction of a radar beam by utilizing a stabilized optical telescope directed toward a star near the radar target location. This innovative approach allows for measuring the target refraction as observed from ships at sea without prior knowledge of the local refraction index or weather conditions in the target area. The telescope may employ an infra-red (IR) sensor and is capable of imaging stars. The atmospheric refraction of the star light is determined by pointing the telescope based on star ephemeris data and measuring the star image deviation from the center of the telescope's field-of-view (FOV). The corresponding refraction of the radar beam can be determined by employing a conversion factor relating the IR-to-RF atmospheric propagation characteristics, which can be obtained through dedicated tracking measurements.

Another significant patent is focused on the "Calibration of ship attitude reference." In this invention, a ship includes a star tracker mounted on a platform stabilized in East-North-Up (ENU) by the inertial navigation system (INS). The line-of-sight (LOS) of the star tracker is directed toward two separated stars, and the LOS difference angles are noted. These angles are processed to generate vector triads representing geodetic (ephemeris) and navigation system attitude. The triads are further processed to generate a coordinate transformation matrix, which is separated into systematic error and reference attitude error. The reference attitude error is summed with the inertial navigation system attitude to generate corrected ENU attitude. This corrected attitude is used as a reference for shipboard sensors, reducing errors when the sensor data is linked to other platforms.

Career Highlights

Jerzy W Luk-Paszyc is currently employed at Lockheed Martin Corporation, where he continues to develop innovative solutions in radar technology. His work has significantly impacted the field, particularly in enhancing the accuracy of radar systems and navigation technologies.

Collaborations

Throughout his career, Jerzy has collaborated with notable

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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