The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Jul. 11, 2011
Jerzy W. Luk-paszyc, Vorhees, NJ (US);
Jonathan A. Boardman, Mt. Laurel, NJ (US);
Jerzy W. Luk-Paszyc, Vorhees, NJ (US);
Jonathan A. Boardman, Mt. Laurel, NJ (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A method determines the atmospheric refraction of a radar beam by utilizing a stabilized optical telescope directed toward a star near the radar target location. This allows measuring the target refraction as observed from ships at sea without a-priori knowledge of the local refraction index or weather conditions in the target area. The telescope may employ an infra-red (IR) sensor and is capable of imaging stars. The atmospheric refraction of the star light is determined by pointing the telescope based on star ephemeris data, and measuring the star image deviation from the center of the telescope's field-of-view (FOV). The corresponding refraction of the radar beam can be determined by employing a conversion factor relating the IR-to-RF atmospheric propagation characteristics. This conversion factor can be obtained by dedicated tracking measurements.