This inventor holds 2 USPTO granted patents. Top assignee: 3M Innovative Properties Company. Active years: 2003-2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003-2004
Title: Innovations of Jerry J Fizel in Wafer Polishing Technology
Introduction
Jerry J Fizel is a notable inventor based in River Falls, WI (US). He has made significant contributions to the field of wafer polishing technology, holding 2 patents that showcase his innovative approach to improving manufacturing processes.
Latest Patents
Fizel's latest patents include an abrasive article having a window system for polishing wafers. This invention outlines a process for planarizing, polishing, or modifying a wafer surface or other workpieces. The process utilizes an abrasive article with a textured abrasive coating affixed to a backing. A key feature of this abrasive article is a monitoring element, such as a window, which allows for the transmission of radiation. This radiation level is monitored throughout the planarization process to determine the approach of the desired endpoint. The window in the abrasive coating can either be an area devoid of abrasive coating or have minimal or thinned abrasive coating.
Career Highlights
Fizel is associated with 3M Innovative Properties Company, where he has been able to apply his expertise in developing advanced polishing technologies. His work has contributed to enhancing the efficiency and effectiveness of wafer processing.
Collaborations
Throughout his career, Fizel has collaborated with notable colleagues, including Michael J Muilenburg and Chong-Yong J Kim. These collaborations have further enriched his innovative endeavors and contributed to the success of his projects.
Conclusion
Jerry J Fizel's contributions to wafer polishing technology exemplify the impact of innovation in manufacturing processes. His patents reflect a commitment to advancing technology and improving efficiency in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
