Meridian, ID, United States of America

Jerry A Young

This inventor holds 1 USPTO granted patent. Top assignee: Micron Technology Incorporated. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jerry A Young. Retrieved from https://idiyas.com/inventor/jerry-a-young-muevyfce

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 72(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Jerry A Young: Innovator in Integrated Circuit Testing

Introduction

Jerry A Young is a notable inventor based in Meridian, ID (US). He has made significant contributions to the field of integrated circuits (ICs) fabrication and testing. His innovative approach has led to advancements that enhance the efficiency of IC production.

Latest Patents

Jerry A Young holds a patent for an IC pin forming machine with integrated IC testing capability. This invention relates to the fabrication and testing of integrated circuits. The machine is designed to trim and form IC pins or leads while also allowing for electrical testing of the ICs for defects. Uniquely, testing can occur at any pin forming station after the IC pins have been electrically isolated, enabling earlier detection of issues post-encapsulation.

Career Highlights

Jerry A Young is associated with Micron Technology Incorporated, where he applies his expertise in integrated circuit technology. His work has contributed to the company's reputation as a leader in semiconductor manufacturing.

Collaborations

Jerry has collaborated with notable colleagues, including Steven L Mitchell and Steven W Heppler. Their combined efforts have fostered innovation within the company and the industry.

Conclusion

Jerry A Young's contributions to integrated circuit technology exemplify the impact of innovation in the semiconductor field. His patent for an IC pin forming machine with integrated testing capability showcases his commitment to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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