La Tronche, France

Jerome Petit

This inventor holds 1 USPTO granted patent. Top assignee: Commissariat a L'energie Atomique Et Aux Energies Alternatives. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jerome Petit. Retrieved from https://idiyas.com/inventor/jerome-petit-lat70cmj

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: **Jerome Petit - Innovator in Optical Measurement Technologies**

Introduction

Jerome Petit is a notable inventor based in La Tronche, France, recognized for his significant contributions to the field of microelectronics. With his expertise, he has secured a patent that holds promise for enhancing dimensional control in various applications.

Latest Patents

Jerome Petit holds a patent focused on the "Use of optical Fourier transform for dimensional control in microelectronics." This innovative device measures the dimensional and structural characteristics of objects with precision. It incorporates a detector that forms an optical Fourier transform image of an elemental surface of the object, allowing a processor to generate data related to various dimensional and structural characteristics based on information gathered by the detector.

Career Highlights

Jerome is associated with the Commissariat à l'Énergie Atomique, a key player in the advancement of energy technologies and research. His role within this prestigious organization enhances his ability to innovate and contribute to the industry.

Collaborations

Throughout his career, Jerome Petit has collaborated with talented individuals such as Patrick Chaton and Gilles Grand. These partnerships have played a crucial role in the development of his patented technologies and innovations.

Conclusion

In conclusion, Jerome Petit is a remarkable figure in the realm of microelectronics, whose work in optical measurement advancements stands out. His patent reflects a fusion of creativity and technical expertise, promising to make significant contributions to the industry. As technology continues to evolve, Jerome's innovations pave the way for future developments in dimensional control and measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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