The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2009
Filed:
Sep. 17, 2004
Applicants:
Jerome Petit, La Tronche, FR;
Patrick Chaton, Theys, FR;
Gilles Grand, Grenoble, FR;
Thierry Leroux, Caen, FR;
Inventors:
Jerome Petit, La Tronche, FR;
Patrick Chaton, Theys, FR;
Gilles Grand, Grenoble, FR;
Thierry Leroux, Caen, FR;
Assignee:
Commissariat a l'Energie Atomique, Paris, FR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
A device for measuring the dimensional or structural characteristics of an object. A detector forms an optical Fourier transform image of an elemental surface of the object in an image focal plane. A processor produces data relating to at least one dimensional and/or structural characteristic of the object from the information provided by the detector.