Seoul, South Korea

Jeong Moon Lee

This inventor holds 1 USPTO granted patent and 6 published patent applications. Top assignee: Samsung Display Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeong Moon Lee. Retrieved from https://idiyas.com/inventor/jeong-moon-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Jeong Moon Lee: Innovator in Optical Inspection Technology

Introduction

Jeong Moon Lee is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of optical inspection technology. His innovative work has led to the development of a unique optical inspection device that enhances the efficiency of inspection processes.

Latest Patents

Jeong Moon Lee holds a patent for an optical inspection device and inspecting method using the same. This device includes a barrel, a first light source unit configured to irradiate light of a first wavelength range, and a second light source unit that emits light of a different wavelength range. The design allows for improved inspection capabilities by utilizing distinct light paths for each source.

Career Highlights

Jeong Moon Lee is currently employed at Samsung Display Co., Ltd., where he continues to push the boundaries of optical inspection technology. His work has been instrumental in advancing the capabilities of inspection devices used in various applications.

Collaborations

Some of his notable coworkers include Dae Hong Kim and Hyung Lee, who contribute to the innovative environment at Samsung Display Co., Ltd. Their collaborative efforts enhance the development of cutting-edge technologies in the field.

Conclusion

Jeong Moon Lee's contributions to optical inspection technology exemplify the spirit of innovation. His patent and work at Samsung Display Co., Ltd. highlight his role as a key figure in advancing inspection methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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