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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12222294 B1

PDFFull Text
Date of Patent:
Feb. 11, 2025

Filed:

May. 05, 2022

Optical inspection device and inspecting method using the same

Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Jeong Moon Lee, Seoul, KR;

Dae Hong Kim, Seongnam-si, KR;

Hyung Jin Lee, Suwon-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:

Lewis Roca Rothgerber Christie LLP

Primary Examiner:

Michelle M Iacoletti

Assistant Examiner:

Noah J Haney

Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/31 (2006.01); G01N 21/33 (2006.01); G01N 21/35 (2014.01); G01N 21/84 (2006.01); G01N 21/94 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/3151 (2013.01); G01N 21/33 (2013.01); G01N 21/35 (2013.01); G01N 21/8422 (2013.01); G01N 21/88 (2013.01); G01N 21/8851 (2013.01); G01N 21/94 (2013.01); G01N 21/31 (2013.01); G01N 2021/3155 (2013.01); G01N 2021/3174 (2013.01); G01N 2021/8835 (2013.01); G01N 2021/8845 (2013.01); G01N 2021/945 (2013.01); G01N 21/95 (2013.01); G01N 2201/066 (2013.01);
Abstract

An optical inspection device includes: a barrel; a first light source unit at a first side of the barrel and configured to irradiate light of a first wavelength range through a first light path; a second light source unit at a second side of the barrel, the second side being different from the first side, and configured to irradiate light of a second wavelength range that is different from the first wavelength range through a second light path; and a camera. At least a portion of the first light path is different from the second light path.

Find Patent Forward Citations

Lee, Jeong. (2025). Optical inspection device and inspecting method using the same (U.S. Patent No. 12222294). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12222294

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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