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For the Inventor, By the Inventor

Bucheon, South Korea

Jeong Hun Choi

This inventor holds 4 USPTO granted patents and 4 EPO patents. Top assignee: Koh Young Technology Inc.. Active years: 2020-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeong Hun Choi. Retrieved from https://idiyas.com/inventor/jeong-hun-choi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.7

ph-index = 1


Company Filing History:

goldMedal4 out of 178 
 
Koh Young Technology Inc.
 patents

Years Active: 2020-2023

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4 patents (USPTO):Explore Patents
1. 11659999 - OCT system, method of generating OCT image and storage medium (2023-05-30),
2. 11543238 - Apparatus for inspecting substrate and method thereof (2023-01-03),
3. 10859371 - Apparatus for inspecting substrate and method thereof (2020-12-08),
4. 10852125 - Apparatus for inspecting film on substrate by using optical interference and method thereof (2020-12-01),

Title: Innovations of Jeong Hun Choi

Introduction: Jeong Hun Choi is a notable inventor based in Bucheon-si, South Korea. He has made significant contributions to the field of optical technology, holding a total of 4 patents. His work focuses on enhancing imaging systems and substrate inspection methods.

Latest Patents: Among his latest patents is an OCT system and method of generating OCT images, which addresses the correction of three-dimensional images distorted by coherence gate curvature (CGC). This method involves generating a three-dimensional image from an interference signal, creating a CGC profile, and correcting the interference signal using a CGC fitting curve. Another significant patent is for a substrate inspection apparatus that utilizes ultraviolet light and laser technology to derive the thickness of coated films on substrates.

Career Highlights: Jeong Hun Choi is currently employed at Koh Young Technology Inc., where he continues to innovate in the field of optical inspection and imaging technologies. His work has been instrumental in advancing the capabilities of substrate inspection systems.

Collaborations: He has collaborated with notable colleagues such as Young Joo Hong and Deok Hwa Hong, contributing to various projects that enhance the functionality and efficiency of optical systems.

Conclusion: Jeong Hun Choi's contributions to optical technology and substrate inspection demonstrate his commitment to innovation and excellence in his field. His patents reflect a deep understanding of complex imaging systems and their applications in real-world scenarios.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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