Gemmrigheim, Germany

Jens Schuster

This inventor holds 1 USPTO granted patent. Top assignee: Nice Solar Energy Gmbh. Active years: 2020.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Jens Schuster: Innovator in Layer Thickness Measurement Technology

Introduction

Jens Schuster is a notable inventor based in Gemmrigheim, Germany. He has made significant contributions to the field of vapor deposition methods, particularly in layer thickness measurement technology. His innovative approach has led to the development of a unique patent that enhances the precision of layer applications.

Latest Patents

Jens Schuster holds a patent for an "Apparatus and method for layer thickness measurement for a vapor deposition method." This invention features a measuring assembly that includes a measuring head equipped with at least one vibration plate. The design incorporates an extraction line that connects a vacuum chamber for the vapor deposition method to the measuring head. This extraction line is designed to include at least one heating section or cooling section, allowing for improved measurement accuracy.

Career Highlights

Jens Schuster is currently employed at Nice Solar Energy GmbH, where he applies his expertise in innovative technologies. His work focuses on enhancing the efficiency and effectiveness of solar energy solutions through advanced measurement techniques.

Collaborations

Throughout his career, Jens has collaborated with talented professionals such as Michael Pisch and Matthias Gang. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Jens Schuster's contributions to layer thickness measurement technology exemplify his commitment to innovation in the field. His patent and work at Nice Solar Energy GmbH highlight his role as a key player in advancing vapor deposition methods.

Profile summary based on public USPTO records.
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