Stuttgart, Germany

Jens Dressler

This inventor holds 1 USPTO granted patent. Top assignee: Advantest (Singapore) Pte Ltd. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jens Dressler. Retrieved from https://idiyas.com/inventor/jens-dressler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Jens Dressler: Innovator in Data Processing Technologies

Introduction

Jens Dressler is a notable inventor based in Stuttgart, Germany. He has made significant contributions to the field of data processing technologies. His innovative work has led to the development of a unique patent that addresses specific challenges in data word sequences.

Latest Patents

Jens Dressler holds a patent for a "Method and apparatus for the determination of a repetitive bit value pattern." This invention focuses on determining a repetitive bit value pattern associated with a predetermined bit position within a sequence of data words. The data words consist of two or more bits, and the method utilizes program loop information to derive updated bit values. The patent highlights the evaluation of a program expression over a number of loop iterations, which ultimately leads to the identification of the repetitive bit value pattern.

Career Highlights

Jens Dressler is currently employed at Advantest (Singapore) Pte Ltd, where he continues to work on innovative solutions in the field of data processing. His expertise and contributions have been instrumental in advancing the company's technological capabilities.

Collaborations

Jens collaborates with his coworker, Jens Sundermann, to further enhance their projects and drive innovation within their team.

Conclusion

Jens Dressler's work exemplifies the spirit of innovation in data processing technologies. His patent and ongoing contributions reflect his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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