Pleasanton, CA, United States of America

Jenq-Thun Li

This inventor holds 1 USPTO granted patent. Top assignees: Roche Molecular Systems, Inc., Sandstone Diagnostics, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jenq-Thun Li. Retrieved from https://idiyas.com/inventor/jenq-thun-li-tzb559pd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Jenq-Thun Li

Introduction

Jenq-Thun Li is an accomplished inventor based in Pleasanton, CA (US). She has made significant contributions to the field of particle concentration determination through her innovative inventions. Her work has implications in various scientific and medical applications.

Latest Patents

Jenq-Thun Li holds a patent for "Devices and methods for determining particle concentration in a sample." This invention features a cartridge designed to determine the concentration of target cells within a sample. The cartridge includes a separation portion and a detection portion. The separation portion contains a density medium that allows for the effective separation of target cells from the sample. The detection portion is configured to capture the target cells, enhancing the accuracy of the concentration determination.

Career Highlights

Throughout her career, Jenq-Thun Li has worked with notable companies, including Roche Molecular Systems, Inc. and Sandstone Diagnostics, Inc. Her experience in these organizations has contributed to her expertise in developing innovative solutions in the field of particle analysis.

Collaborations

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Conclusion

Jenq-Thun Li's contributions to the field of particle concentration determination highlight her innovative spirit and dedication to advancing scientific knowledge. Her patent and career achievements reflect her significant impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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