West Chester, PA, United States of America

Jennifer Prem

This inventor holds 1 USPTO granted patent. Top assignee: Bank of America Corporation. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jennifer Prem. Retrieved from https://idiyas.com/inventor/jennifer-prem

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 10.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Jennifer Prem - Innovator in Testing Analytics

Introduction

Jennifer Prem is an accomplished inventor based in West Chester, PA (US). She has made significant contributions to the field of testing analytics, showcasing her expertise through her innovative patent.

Latest Patents

Jennifer holds a patent for a testing analytics tool. This invention relates to systems, methods, and computer program products designed for testing analytics. The embodiments disclosed in her patent provide for automating the collection and storage of test data, automating test performance calculations across various segments within the test group, and automating the delivery of test result information.

Career Highlights

Jennifer Prem is currently employed at Bank of America Corporation, where she applies her skills and knowledge in analytics. Her work has been instrumental in enhancing the efficiency of testing processes within the organization.

Collaborations

Some of her notable coworkers include Mei-Ling Johnson and James A. Greco. Their collaboration contributes to a dynamic work environment that fosters innovation and creativity.

Conclusion

Jennifer Prem is a remarkable inventor whose work in testing analytics has the potential to transform the industry. Her contributions reflect her dedication to advancing technology and improving testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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