The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2012

Filed:

Oct. 30, 2009
Applicants:

Michael David Napolin, Middletown, DE (US);

Jennifer Prem, West Chester, PA (US);

Ronald A. Hollis, Jr., Bear, DE (US);

Chunrong LI, Columbia, MD (US);

Mei-ling Johnson, Elsmere, DE (US);

Brooke Marie Durham, Wilmington, DE (US);

Michael Newbold, Jr., Hockessin, DE (US);

Matthew Thomas Rice, Wilmington, DE (US);

James A. Greco, Elkton, MD (US);

Hans D. Schumacher, Matthews, NC (US);

Inventors:

Michael David Napolin, Middletown, DE (US);

Jennifer Prem, West Chester, PA (US);

Ronald A. Hollis, Jr., Bear, DE (US);

Chunrong Li, Columbia, MD (US);

Mei-Ling Johnson, Elsmere, DE (US);

Brooke Marie Durham, Wilmington, DE (US);

Michael Newbold, Jr., Hockessin, DE (US);

Matthew Thomas Rice, Wilmington, DE (US);

James A. Greco, Elkton, MD (US);

Hans D. Schumacher, Matthews, NC (US);

Assignee:

Bank of America Corporation, Charlotte, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the invention relate to systems, methods, and computer program products for testing analytics. Embodiments herein disclosed provide for automating the collection and storage of test data, automating test performance calculations across a multitude of segments within the test group and automating test result information delivery.


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