Jehn-Huar Chem

Title: Jehn-Huar Chem: Innovator in Semiconductor Imaging Technology

Introduction

Jehn-Huar Chem is a notable inventor based in Morgan Hill, CA (US). He has made significant contributions to the field of semiconductor imaging technology. His innovative work has led to the development of a patent that addresses critical challenges in identifying defects in semiconductor dies.

Latest Patents

Jehn-Huar Chem holds a patent titled "Multi-pass imaging using image sensors with variably biased channel-stop contacts for identifying defects in a semiconductor die." This patent involves generating first and second images of a semiconductor die or a portion thereof. Each image is created through time-domain integration (TDI) along multiple pixel columns in an imaging sensor, utilizing light scattered from the semiconductor die. The process includes applying different biases to the electrically conductive contacts of channel stops during the imaging process. This innovative approach allows for the identification of defects in the semiconductor die effectively.

Career Highlights

Jehn-Huar Chem is currently employed at Kla Corporation, where he continues to advance semiconductor imaging technologies. His work has been instrumental in enhancing the accuracy and efficiency of defect detection in semiconductor manufacturing processes. With a total of 1 patent, Chem's contributions are recognized within the industry.

Collaborations

Some of Jehn-Huar Chem's coworkers include Tzi-Cheng Lai and Stephen Biellak. Their collaborative efforts contribute to the innovative environment at Kla Corporation, fostering advancements in semiconductor technology.

Conclusion

Jehn-Huar Chem's work in semiconductor imaging technology exemplifies the impact of innovation in the field. His patent demonstrates a significant advancement in defect identification, showcasing his expertise and commitment to improving semiconductor manufacturing processes.