This inventor holds 1 USPTO granted patent. Top assignee: The Perkin-Elmer Corporation. Active years: 1986.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1986
Title: Innovations of Jeffrey W. Grotts
Introduction
Jeffrey W. Grotts is an accomplished inventor based in Bethel, CT (US). He has made significant contributions to the field of illumination technology. His innovative work has led to the development of a unique patent that addresses the detection of irradiation angles.
Latest Patents
One of Jeffrey's notable patents is the "Non-imaging illumination incidence angle detection system." This invention features a non-imaging detector designed to directly measure the angle of incidence of irradiation from an illuminating source. The system includes a slit mask that transmits narrow lines of irradiation across an array of detectors. These detectors are configured to generate photocurrents that exponentially increase as the irradiation lines move along the array in response to changes in the angle of incidence. The design utilizes an exponential formula, allowing adjacent rows of detectors to produce photocurrents. This results in a signal directly proportional to the incidence angle when processed by associated circuitry.
Career Highlights
Jeffrey W. Grotts has dedicated his career to advancing illumination technologies. He is currently employed at PerkinElmer Corporation, where he continues to innovate and develop new solutions in the field. His work has garnered attention for its practical applications and technical sophistication.
Collaborations
Jeffrey has collaborated with various professionals in his field, including his coworker Rene Abreu. Their combined expertise has contributed to the success of their projects and innovations.
Conclusion
Jeffrey W. Grotts is a notable inventor whose work in illumination technology has led to significant advancements. His patent for a non-imaging illumination incidence angle detection system exemplifies his innovative spirit and dedication to improving detection methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
