The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 1986
Filed:
Oct. 29, 1982
Jeffrey W Grotts, Bethel, CT (US);
Rene Abreu, New Fairfield, CT (US);
The Perkin-Elmer Corporation, Norwalk, CT (US);
Abstract
A non-imaging detector for directly measuring the angle of incidence of irradiation in one plane from an illuminating source. The detector includes a slit mask that transmits narrow lines of irradiation across an array of detectors closely underlying the slit mask. The detectors are configured to generate photocurrents whose ratio exponentially increase as the irradiation lines through the slits move along the array in response to changes in angle of incidence. The detectors are configured according to an exponential formula so that adjacent rows of detectors produce photocurrents so that the photocurrent log difference from adjacent rows will result in a signal directly proportional to incidence angle when subtracted by associated circuitry.