Ann Arbor, MI, United States of America

Jeffrey S White

This inventor holds 4 USPTO granted patents. Top assignee: Perceptron, Inc.. Active years: 2000-2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeffrey S White. Retrieved from https://idiyas.com/inventor/jeffrey-s-white-d46nzrg6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 75.0

Average Co-Inventor Count = 3.0

ph-index = 4

Forward Citations = 119(Granted Patents)


Company Filing History:


Years Active: 2000-2004

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4 patents (USPTO):Explore Patents

Title: The Innovations of Jeffrey S. White

Introduction

Jeffrey S. White is a notable inventor based in Ann Arbor, MI (US). He has made significant contributions to the field of measurement systems, particularly in processing measurement signals to obtain values for physical parameters. With a total of 4 patents to his name, his work has advanced the understanding and application of measurement technologies.

Latest Patents

Among his latest patents, one notable invention is a method and system for processing measurement signals to obtain a value for a physical parameter. This invention focuses on a measurement system where time-varying physical signals containing frequency information related to a physical parameter of an object are measured. The method involves extracting frequency information from these measurement signals, which includes at least one desired frequency. The physical signals in this context are electromagnetic signals, and the object of measurement can be a film formed on a substrate, with the physical parameter being the thickness of the layer.

Another significant patent by Jeffrey S. White is also centered on processing measurement signals to obtain a value for a physical parameter. This method involves measuring time-varying physical signals that contain frequency information. The extraction process transforms the ultrasonic signals to a Z-domain, allowing for the conversion of at least one zero or pole in the Z-domain to the desired frequency and its decay rate. This innovative approach enhances the accuracy and efficiency of measurement systems.

Career Highlights

Jeffrey S. White is currently associated with Perceptron, Inc., where he continues to develop and refine measurement technologies. His work has been instrumental in advancing the capabilities of measurement systems, making them more reliable and effective in various applications.

Collaborations

Throughout his career, Jeffrey has collaborated with notable colleagues, including Frederick P. LaPlant and John W. Dixon. These collaborations have contributed to the development of innovative solutions in the field of measurement systems.

Conclusion

Jeffrey S. White's contributions to the field of measurement technology through his patents and collaborations highlight his role as a significant inventor. His innovative methods for processing measurement signals have paved the way for advancements in understanding physical parameters.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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