Lancaster, NY, United States of America

Jeffrey R Maines

This inventor holds 1 USPTO granted patent. Top assignee: Leica Microsystems Inc.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeffrey R Maines. Retrieved from https://idiyas.com/inventor/jeffrey-r-maines

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jeffrey R. Maines

Introduction

Jeffrey R. Maines is an accomplished inventor based in Lancaster, NY (US). He has made significant contributions to the field of technology, particularly with his innovative work on refractometers. His dedication to advancing scientific instruments has earned him recognition in the industry.

Latest Patents

Jeffrey holds 1 patent for his invention of a refractometer. This device is essential for measuring the refractive index of liquids, which is crucial in various scientific and industrial applications. His patent reflects his commitment to enhancing measurement accuracy and efficiency.

Career Highlights

Jeffrey is currently employed at Leica Microsystems Inc., a company known for its precision optics and imaging systems. His role at Leica Microsystems allows him to work on cutting-edge technologies that contribute to advancements in microscopy and imaging.

Collaborations

Jeffrey collaborates with talented professionals in his field, including his coworker Erin D. Spring. Together, they work on innovative projects that push the boundaries of technology and improve existing scientific tools.

Conclusion

Jeffrey R. Maines is a notable inventor whose work on refractometers exemplifies his innovative spirit and dedication to scientific advancement. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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