Fishkill, NY, United States of America

Jeffrey Paul Gilfford

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeffrey Paul Gilfford. Retrieved from https://idiyas.com/inventor/jeffrey-paul-gilfford

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 536(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jeffrey Paul Gilfford

Introduction

Jeffrey Paul Gilfford is a notable inventor based in Fishkill, NY (US). He has made significant contributions to the field of semiconductor manufacturing. His innovative work has led to the development of a patented system that enhances the efficiency of manufacturing processes.

Latest Patents

Gilfford holds 1 patent for a semiconductor manufacturing process monitoring system. This system is designed to communicate with various process tools and monitor each tool during a predetermined process window time. It provides users with errors and warnings, allowing for timely corrective actions. Furthermore, the system can initiate automatic adjustments of the process tools to ensure efficient manufacturing operations.

Career Highlights

Jeffrey Paul Gilfford is associated with International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to focus on advancing semiconductor technologies and improving manufacturing processes.

Collaborations

One of his notable coworkers is Clayton David Menser, Jr. Together, they have contributed to the development of innovative solutions in the semiconductor industry.

Conclusion

Jeffrey Paul Gilfford's contributions to semiconductor manufacturing through his patented innovations demonstrate his commitment to enhancing technology in this critical field. His work continues to influence the efficiency of manufacturing processes today.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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