The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7720560 B1

PDF
Full Text
Expired
Date of Patent:
May. 18, 2010

Filed:

Jul. 26, 2007
Applicants:

Clayton David Menser, Jr., Marlboro, NY (US);

Jeffrey Paul Gilfford, Fishkill, NY (US);

Inventors:

Clayton David Menser, Jr., Marlboro, NY (US);

Jeffrey Paul Gilfford, Fishkill, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G05B 9/02 (2006.01); G06F 11/30 (2006.01); G21C 17/00 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for monitoring a semiconductor manufacturing process is disclosed. The system communicates with one or more process tools, and monitors each tool during a predetermined process window time. Errors and warnings are provided to users, allowing corrective action to be taken. Additionally, the system of the present invention can initiate automatic adjustment of the process tools to maintain an efficient manufacturing operation.

Published as:

Find Patent Forward Citations

Menser, Jr., Clayton. (2010). Semiconductor manufacturing process monitoring (U.S. Patent No. 7720560). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7720560

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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