Sunnyvale, CA, United States of America

Jeffrey McCallion

This inventor holds 1 USPTO granted patent. Top assignee: Yamaichi Electronics USA, Inc.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeffrey McCallion. Retrieved from https://idiyas.com/inventor/jeffrey-mccallion

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Jeffrey McCallion

Introduction

Jeffrey McCallion is a notable inventor based in Sunnyvale, CA. He has made significant contributions to the field of semiconductor technology. His work focuses on enhancing the efficiency and effectiveness of testing methods for semiconductor devices.

Latest Patents

One of Jeffrey's key inventions is a patent for a High Insertion Count Test Socket. This innovative test socket comprises a base with a top loading area, an actuator rotatably coupled to the base, and a pushing device that is pressed against a semiconductor device when placed onto the top loading area. The actuator can be moved to a first position, such as a test position, to facilitate the testing process. This invention is crucial for improving the reliability and performance of semiconductor testing.

Career Highlights

Jeffrey McCallion is currently employed at Yamaichi Electronics USA, Inc., where he continues to develop and refine testing technologies. His expertise in semiconductor testing has positioned him as a valuable asset to his company and the industry at large.

Collaborations

Jeffrey collaborates with various professionals in his field, including his coworker Adam Cole. Their combined efforts contribute to the advancement of semiconductor testing technologies.

Conclusion

Jeffrey McCallion's innovative work in semiconductor testing exemplifies the importance of invention in technology. His contributions, particularly the High Insertion Count Test Socket, highlight his commitment to improving testing methods in the semiconductor industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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