Yamaichi Electronics USA, Inc.

Jeffrey McCallion

Adam Cole

A test socket and method for using the same are disclosed herein. In one embodiment, the test socket comprises a base having a top loading area, an actuator rotatably coupled to the base, and a pushing device rotatably coupled to the actuator, where the pushing device is pressed against a semiconductor device when the semiconductor device is placed onto the top loading area and the actuator is moved to a first position (e.g., a test position).

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Sunnyvale, CA, United States of America

Jeffrey McCallion