Location History:
- Bloomington, MN (US) (2001)
- Deephaven, MN (US) (2004 - 2016)
Company Filing History:
Years Active: 2001-2016
Title: The Innovations of Jeffrey L O'Dell
Introduction
Jeffrey L O'Dell is a notable inventor based in Deephaven, MN (US), recognized for his contributions to the field of automated wafer inspection technology. With a total of six patents to his name, O'Dell has made significant advancements that enhance the efficiency and accuracy of wafer defect inspections.
Latest Patents
One of O'Dell's latest patents is an automated wafer defect inspection system and a process for performing such inspections. This innovative system is designed for use on various types of wafers, including patterned, whole, broken, partial, and sawn wafers. It is specifically intended for second optical wafer inspection, addressing defects such as metalization defects, diffusion defects, passivation layer defects, scribing defects, glassivation defects, chips and cracks from sawing, solder bump defects, and bond pad area defects. This technology plays a crucial role in ensuring the quality and reliability of semiconductor manufacturing.
Career Highlights
Throughout his career, O'Dell has worked with prominent companies in the industry, including August Technology Corporation and Rudolph Technologies, Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to the advancement of wafer inspection technologies.
Collaborations
O'Dell has collaborated with notable professionals in the field, including Mark Harless and Thomas Verburgt. These collaborations have further enriched his work and have led to the development of cutting-edge technologies in wafer inspection.
Conclusion
Jeffrey L O'Dell's contributions to the field of automated wafer inspection are significant and impactful. His innovative patents and collaborations with industry professionals highlight his dedication to advancing technology in semiconductor manufacturing.