This inventor holds 1 USPTO granted patent. Top assignee: Texas A&M University System. Active years: 2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007
Title: Innovations by Jeffrey Kao in Particle Analysis
Introduction
Jeffrey Kao is an accomplished inventor based in Lake Jackson, Texas. He has made significant contributions to the field of particle analysis through his innovative patent. His work focuses on the self-calibrating, on-line determination of particle size distribution and volume fraction in various mediums.
Latest Patents
Jeffrey Kao holds a patent for a "Particle analysis system and method." This system and method are designed for the self-calibrating, on-line determination of size distribution f(x) and volume fraction φ of particles dispersed in a medium. The technology involves detecting propagation characteristics of multiply scattered light from the particles. The system is capable of calculating isotropic scattering and absorption coefficients by comparing incident and detected light, allowing for accurate measurements of particle characteristics.
Career Highlights
Kao's career is marked by his association with the University of Texas System, where he has been able to apply his expertise in particle analysis. His innovative approach has led to advancements in understanding particle interactions and their effects on light scattering, particularly at high concentrations.
Collaborations
Throughout his career, Jeffrey has collaborated with notable colleagues, including Eva M Sevick-Muraca and Joseph Earl Pierce. These collaborations have further enriched his research and contributed to the development of his patented technologies.
Conclusion
Jeffrey Kao's contributions to particle analysis through his innovative patent demonstrate his commitment to advancing scientific understanding in this field. His work continues to influence research and applications in particle characterization.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile