The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2007
Filed:
Nov. 07, 1997
Eva Sevick-muraca, Lafayette, IN (US);
Joseph Pierce, Appleton, WI (US);
Steven Richter, Brunswick, GA (US);
Rajesh Shinde, West Lafayette, IN (US);
Ganesh Balgi, Lebanon, IN (US);
Jeffrey Kao, Lake Jackson, TX (US);
Huabei Jiang, Clemson, SC (US);
Eva Sevick-Muraca, Lafayette, IN (US);
Joseph Pierce, Appleton, WI (US);
Steven Richter, Brunswick, GA (US);
Rajesh Shinde, West Lafayette, IN (US);
Ganesh Balgi, Lebanon, IN (US);
Jeffrey Kao, Lake Jackson, TX (US);
Huabei Jiang, Clemson, SC (US);
The Texas A&M University System, College Station, TX (US);
Abstract
A system () and method are disclosed for the self-calibrating, on-line determination of size distribution f(x) and volume fraction φ of a number of particles (P) dispersed in a medium () by detecting one or more propagation characteristics of multiply scattered light from the particles (P). The multiply scattered light is re-emitted in response to exposure to a light source () configured to provide light at selected wavelengths. The determination includes calculating the isotropic scattering and absorption coefficients for the particles (P) by comparing the incident and detected light to determine a measurement corresponding to the propagation time through the scattering medium (), and iteratively estimating the size distribution f(x) and volume fraction φ as a function of the coefficients for each of the wavelengths. An estimation approach based on an expected form of the distribution and the mass of the particles is also disclosed. Furthermore, techniques to determine a particle structure factor indicative of particle-to-particle interactions which vary with particle concentration and influence light scattering at high concentrations is disclosed.