Company Filing History:
Years Active: 2007
Title: Innovations by Steven Richter in Particle Analysis
Introduction
Steven Richter is an accomplished inventor based in Brunswick, GA (US). He has made significant contributions to the field of particle analysis through his innovative patent. His work focuses on the self-calibrating, on-line determination of particle size distribution and volume fraction in various mediums.
Latest Patents
Richter holds a patent for a "Particle analysis system and method." This system and method are designed for the self-calibrating, on-line determination of size distribution f(x) and volume fraction φ of particles dispersed in a medium. The technology involves detecting propagation characteristics of multiply scattered light from the particles. The system utilizes a light source configured to provide light at selected wavelengths, allowing for the calculation of isotropic scattering and absorption coefficients. This innovative approach enables the iterative estimation of size distribution and volume fraction based on the coefficients for each wavelength.
Career Highlights
Steven Richter is affiliated with the University of Texas System, where he continues to advance research in particle analysis. His work has implications for various industries, including pharmaceuticals and materials science. With a focus on enhancing measurement techniques, Richter's contributions are paving the way for more accurate particle analysis.
Collaborations
Richter has collaborated with notable colleagues, including Eva M Sevick-Muraca and Joseph Earl Pierce. Their combined expertise has further enriched the research and development of particle analysis technologies.
Conclusion
Steven Richter's innovative work in particle analysis exemplifies the impact of dedicated research and development in scientific fields. His patent for a particle analysis system showcases the potential for advancements in measuring particle characteristics, which can benefit various applications.